Selected Journal Papers- N.G. Tarr et al

Selected Journal Papers- N.G. Tarr et al Selected Journal Papers- N.G. Tarr et al

R.H. Griffin, O. Mozenson, M. A. Beking, M. C. DeRosa, G. Lopinski and N.G. Tarr,
"Quantitative Radiolabeled Biomolecule Detection Using a Functionalized CMOS Sensor"
, accepted for publication in IEEE Trans. Nucl. Sci. April 2014

M. Arsalan, A. Shamim, M. Shams, N.G. Tarr and L. Roy,
"Ultra Low Power CMOS-Based Sensor for On-Body Radiation Dose Measurements",
IEEE Journal on Emerging and Selected Topics in Circuits and Systems, vol. PP, issue 99, p. 1 (2012)

P. Chyurlia, H. Tang, F. Semond, J.A. Bardwell, T. Lester, S. Rolfe, and N.G. Tarr,
"GaN HEMT and MOS monolithic integration on Silicon substrates",
Physica Status Solidi C 8 , p 2210-12, 2011 (IWN-2010 special edition)

P. Chyurlia, F.Semond, T. Lester, J.A. Bardwell, S. Rolfe, H. Tang and N.G. Tarr,
"Monolithic integration of AlGaN/GaN HFET with MOS on silicon <111> substrates",
Electronics Lett. 46 , p.240-2 (2010)

L.K. Rowe, M. Elsey, N.G. Tarr, A.P. Knights and E. Post,
"CMOS-compatible optical rib waveguides defined by local oxidation of silicon",
Electronics Lett. 43 , p 392-3 (2007) W.N. Ye, D.-X. Xu, S. Janz, P.D. Waldron, P. Cheben, and N.G. Tarr,
"Passive broadband silicon-on-insulator polarization splitter",
Optics Letters 32 , p.1492-4, (2007)

V. Levenets; R.E.Amaya, N.G. Tarr and T.J. Smy,
"Application of PVD silver for integrated microwave passives in silicon technology",
Solid-St. Elect. 50 , p 1389-94 (2006)

W. Ye, D.-X. Xu, S. Janz, P. Cheben, M.-J. Picard, B. Lamontagne and N.G. Tarr,
"Birefringence control using stress engineering in Silicon-on-Insulator (SOI)",
J. Lightwave Tech. 23 , 1308-1318, (2005)

N.G. Tarr, K. Shortt, Y. Wang and I. Thomson,
"A sensitive, temperature-compensated, zero-bias floating gate MOSFET dosimeter",
IEEE Trans. Nucl. Sci. NS-51 , 1277-1282 (2004)

B. Cyca, K.G. Robins, N.G. Tarr, D-X. Xu, J.-P. Noel, D. Landheer, and M. Simard-Normandin,
"Hole confinement and mobility in heterostructure Si/Ge/Si p-channel metal-oxide-semiconductor field-effect transistors",
J. Appl. Phys. 81 , 8079-83 (1997)

N.G. Tarr, C. Plett, A. Yeaton, G.F. Mackay and I. Thomson,
"Limitations on MOSFET dosimeter resolution imposed by 1/f noise",
IEEE Trans. Nucl. Sci. NS-43 , 2492-5 (1996)

N.G. Tarr, R. Soreefan, T.W. Macelwee, W.M. Snelgrove and S. Bazarjani,
"Simple backgated MOSFET structure for dynamic threshold control in fully-depleted SOI CMOS",
Electronics Lett. 32 , 1093-4 (1996)