Semiconductor Parameter Analyzer
HP 4145A with HP 1658A Test Fixture
Operation Manual: 4145B Operation Manual1989-04-01 17.5 MB
The 4145A Semiconductor Parameter Analyzer performs high speed DC characterization of semiconductor devices and materials automatically, saving you time and money. It has four programmable stimulus/measurement units capable of high resolution plus wide range sourcing and sensing (1 pA to 100 mA; 1 mV to 100 V). Other features include built-in graphics analysis functions including marker and cursor which provides direct numeric readouts and a line function for automatic calculation of line gradient and X-Y axis intercept values. For greater versatility and capabilities the HP 4145A incorporates a built-in flexible disc drive for permanent storage of user programs and measurement results.
HP 4155A
Location:
Graduate Lab. Inv #
Quick Start Guide: 4155B Quick Start Guide2000-01-01 0.77 MB
Programmer's Guide: 4155B Programmer's Guide2000-01-01 2.71 MB
Sample Applications: 4155B Sample Applications Program Guide2000-01-01 3.22 MB
Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs. Synchronized stress/measure function, two high-voltage pulse generator units (±40 V). Time-domain measurement: 60µs–variable intervals, up to 10,001 points. Easy to use: knob-sweep similar to curve tracer, automatic analysis functions. Automation: built-in HP Instrument BASIC, trigger I/O capability
The 576 Curve Tracer is a rugged high power measurement system for tests on 2- and 3-terminal discrete semiconductors. With a collector supply of up to 220 W peak, adjustable current limiting is provided in the step generator. A display area readout of test results and setup parameters decreases the chances of operator error. Voltage step ranges are up to 1500 V and current step ranges are up to 20 A peak pulse. Switchable polarity and display magnification for more accurate resolution.
Location: Graduate Lab. Inv #
The Type 577 Transistor Curve Tracer system, when used with the 177 Standard Test Fixture (sold separately), offers a convenient method of presenting dynamic characteristic transistor curves and a wide range of other semiconductor devices. This series places special emphasis on being able to make low current measurements. Collector supply: (five modes, five ranges) 6.5 V/10 A, 25 V/2.5 A, 100 V/0.6 A, 400 V/0.15 A, 1600 V/0.04 A. Current increments: 5 nA/step to 0.2 A/step ±2%. Voltage increments: 5 mV/step to 2 V/step ±2%.
Sunday, August 22, 2004